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High-g Shock Testing: Generation and Measurement of Long Duration High-g Acceleration Profiles

Topic

Sensors

When & Where

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Mon, 02/23/2026, 11:50 - 12:10

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Gallery Level 3, NCC Ost

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Details

  • Format:

    Lecture

  • Language:

    English

Session description

The reproducible generation and reliable measurement of long duration high-g acceleration profiles is important in the fields of penetration mechanics, shock-testing and high-g hardened electronics. The Fraunhofer EMI has established experimental techniques to generate shock-pulses of several 10,000 g with durations of more than 1 ms. They are easy to perform, comparatively cheap and allow the monitoring of circuitry during the duration of the load. Repeated experiments have been conducted with rectangular acceleration pulses of up to 70,000 g, showing that these techniques are suitable for standardized long duration high-g shock testing. One application was the development (design, selection of components and calibration) of the EMIs family of autonomous shock resistant data recorders &ld ...

Speaker

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Sebastian Hess
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Fraunhofer EMI